Adeboye Stephen Oyeniran, Artjom Jasnetski, Anton Tsertov, Raimund Ubar. High-level test data generation for software-based self-test in microprocessors. In 6th Mediterranean Conference on Embedded Computing, MECO 2017, Bar, Montenegro, June 11-15, 2017. pages 1-6, IEEE, 2017. [doi]
Abstract is missing.