Boosting the Accuracy of Analog Test Coverage Computation through Statistical Tolerance Analysis

Sule Ozev, Alex Orailoglu. Boosting the Accuracy of Analog Test Coverage Computation through Statistical Tolerance Analysis. In 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA. pages 213-222, IEEE Computer Society, 2002. [doi]

Abstract

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