DFT for fast testing of self-timed control circuits

Sandeep Pagey, Ajay Khoche, Erik Brunvand. DFT for fast testing of self-timed control circuits. In 4th Asian Test Symposium (ATS 95), November 23-24, 1995. Bangalore, India. pages 382-386, IEEE Computer Society, 1995. [doi]

Abstract

Abstract is missing.