Electromigration-aware redundant via insertion

Jiwoo Pak, Bei Yu, David Z. Pan. Electromigration-aware redundant via insertion. In The 20th Asia and South Pacific Design Automation Conference, ASP-DAC 2015, Chiba, Japan, January 19-22, 2015. pages 544-549, IEEE, 2015. [doi]

Abstract

Abstract is missing.