Fault diagnosis of automatic mechanism of Gatling gun based on information entropy of second-generation wavelet

Mingzhi Pan, Hongxia Pan, Xu Xin, Huiling Liu. Fault diagnosis of automatic mechanism of Gatling gun based on information entropy of second-generation wavelet. In 14th International Conference on Ubiquitous Robots and Ambient Intelligence, URAI 2017, Jeju, South Korea, June 28 - July 1, 2017. pages 788-793, IEEE, 2017. [doi]

Abstract

Abstract is missing.