Shrinathan Esakimuthu Pandarakone, Keisuke Akahori, Toshiki Matsumura, Yukio Mizuno, Hisahide Nakamura. Development of a methodology for bearing fault scrutiny and diagnosis using SVM. In IEEE International Conference on Industrial Technology, ICIT 2017, Toronto, ON, Canada, March 22-25, 2017. pages 282-287, IEEE, 2017. [doi]
Abstract is missing.