Sujay Pandey, Sanya Gupta, Madhu Sudhan L., Suriya Natarajan, Arani Sinha, Abhijit Chatterjee. Characterization of Library Cells for Open-circuit Defect Exposure: A Systematic Methodology. In IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019. pages 1-10, IEEE, 2019. [doi]
Abstract is missing.