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Modeling and Characterization of VBUS Power Discharge for Embedded Superspeed USB Host/Devices

Maneesh Pandey, Mohit Goyal, Parul Sharma, Rohit Sharma. Modeling and Characterization of VBUS Power Discharge for Embedded Superspeed USB Host/Devices. In 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems, VLSID 2019, Delhi, India, January 5-9, 2019. pages 323-328, IEEE, 2019. [doi]

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