probe card-a solution for at-speed, high density, wafer probing

Rajiv Pandey, Dan Higgins. probe card-a solution for at-speed, high density, wafer probing. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 836-842, IEEE Computer Society, 1998. [doi]

Abstract

Abstract is missing.