Mike Papadakis, Christopher Henard, Yves Le Traon. Sampling Program Inputs with Mutation Analysis: Going Beyond Combinatorial Interaction Testing. In IEEE Seventh International Conference on Software Testing, Verification and Validation, ICST 2014, March 31 2014-April 4, 2014, Cleveland, Ohio, USA. pages 1-10, IEEE, 2014. [doi]
Abstract is missing.