Elpiniki I. Papageorgiou, Theodosis Theodosiou, George Margetis, Nikolaos Dimitriou, Paschalis Charalampous, Dimitrios Tzovaras, Ioannis Samakovlis. Short Survey of Artificial Intelligent Technologies for Defect Detection in Manufacturing. In Nikolaos G. Bourbakis, George A. Tsihrintzis, Maria Virvou, editors, 12th International Conference on Information, Intelligence, Systems & Applications, IISA 2021, Chania Crete, Greece, July 12-14, 2021. pages 1-7, IEEE, 2021. [doi]
Abstract is missing.