George Papandreou, Iasonas Kokkinos, Pierre-André Savalle. Modeling local and global deformations in Deep Learning: Epitomic convolution, Multiple Instance Learning, and sliding window detection. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2015, Boston, MA, USA, June 7-12, 2015. pages 390-399, IEEE, 2015. [doi]
Abstract is missing.