M. E. Paramasivam, R. S. Sabeenian. Handloom Silk Fabric Defect Detection Using First Order Statistical Features on a NIOS II Processor. In Vinu V. Das, R. Vijayakumar, K. G. Srinivasa, Hatim A. Aboalsamh, Mohammad Hammoudeh, Vahid Salmani, Dinesh Kumar Tyagi, Anjali Mohapatra, Bharatheesh Jaysimha, Eliathamby Ambikairajah, Jonathan M. Blackledge, editors, Information and Communication Technologies - International Conference, ICT 2010, Kochi, Kerala, India, September 7-9, 2010. Proceedings. Volume 101 of Communications in Computer and Information Science, pages 475-477, Springer, 2010. [doi]
Abstract is missing.