Back-gate effects and detailed characterization of junctionless transistor

Mukta Singh Parihar, Fan Yu Liu, Carlos Navarro, Sylvain Barraud, Maryline Bawedin, Irina Ionica, Abhinav Kranti, Sorin Cristoloveanu. Back-gate effects and detailed characterization of junctionless transistor. In 45th European Solid State Device Research Conference, ESSDERC 2015, Graz, Austria, September 14-18, 2015. pages 282-285, IEEE, 2015. [doi]

Abstract

Abstract is missing.