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Software Defect Prediction for LSI Designs

Matthieu Parizy, Koichiro Takayama, Yuji Kanazawa. Software Defect Prediction for LSI Designs. In 30th IEEE International Conference on Software Maintenance and Evolution, Victoria, BC, Canada, September 29 - October 3, 2014. pages 565-568, IEEE, 2014. [doi]

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