Challenges on DTCO Methodology Towards Deep Submicron Interconnect Technology

Heechun Park, Kyungjoon Chang, Jooyeon Jeong, Jaehoon Ahn, Ki-Seok Chung, Taewhan Kim. Challenges on DTCO Methodology Towards Deep Submicron Interconnect Technology. In 18th International SoC Design Conference, ISOCC 2021, Jeju Island, South Korea, Republic of, October 6-9, 2021. pages 215-218, IEEE, 2021. [doi]

Abstract

Abstract is missing.