Regressive Testing for System-on-Chip with Unknown-Good-Yield

Noh-Jin Park, Byoungjae Jin, K. M. George, Nohpill Park, Minsu Choi. Regressive Testing for System-on-Chip with Unknown-Good-Yield. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 393-400, IEEE Computer Society, 2003. [doi]

Abstract

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