Segeun Park, Hyuckchai Jung, Jeonghoon Oh, Ilgweon Kim, Hyoungsun Hong, Gyoyoung Jin, Yonghan Roh. Off-state degradation with ac bias in PMOSFET. Microelectronics Reliability, 65:16-19, 2016. [doi]
@article{ParkJOKHJR16,
title = {Off-state degradation with ac bias in PMOSFET},
author = {Segeun Park and Hyuckchai Jung and Jeonghoon Oh and Ilgweon Kim and Hyoungsun Hong and Gyoyoung Jin and Yonghan Roh},
year = {2016},
doi = {10.1016/j.microrel.2016.08.007},
url = {http://dx.doi.org/10.1016/j.microrel.2016.08.007},
researchr = {https://researchr.org/publication/ParkJOKHJR16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {65},
pages = {16-19},
}