Segeun Park, Hyuckchai Jung, Jeonghoon Oh, Ilgweon Kim, Hyoungsun Hong, Gyoyoung Jin, Yonghan Roh. Off-state degradation with ac bias in PMOSFET. Microelectronics Reliability, 65:16-19, 2016. [doi]
@article{ParkJOKHJR16, title = {Off-state degradation with ac bias in PMOSFET}, author = {Segeun Park and Hyuckchai Jung and Jeonghoon Oh and Ilgweon Kim and Hyoungsun Hong and Gyoyoung Jin and Yonghan Roh}, year = {2016}, doi = {10.1016/j.microrel.2016.08.007}, url = {http://dx.doi.org/10.1016/j.microrel.2016.08.007}, researchr = {https://researchr.org/publication/ParkJOKHJR16}, cites = {0}, citedby = {0}, journal = {Microelectronics Reliability}, volume = {65}, pages = {16-19}, }