Jaehwa Park, Young-Bin Kwon. Image Quality Measure Using Sliced Block Distance as a Graphical Element. In Josep Lladós, Young-Bin Kwon, editors, Graphics Recognition, Recent Advances and Perspectives, 5th InternationalWorkshop, GREC 2003, Barcelona, Spain, July 30-31, 2003, Revised Selected Papers. Volume 3088 of Lecture Notes in Computer Science, pages 211-222, Springer, 2003. [doi]
Abstract is missing.