Taeeon Park, Jihwan Kwak, Hongjoon Ahn, Jinwoong Lee, Jaehyuk Lim, Sangho Yu, Changhwan Shin, Taesup Moon. GAN-Based Framework for Unified Estimation of Process-Induced Random Variation in FinFET. IEEE Access, 10:130001-130023, 2022. [doi]
@article{ParkKALLYSM22,
title = {GAN-Based Framework for Unified Estimation of Process-Induced Random Variation in FinFET},
author = {Taeeon Park and Jihwan Kwak and Hongjoon Ahn and Jinwoong Lee and Jaehyuk Lim and Sangho Yu and Changhwan Shin and Taesup Moon},
year = {2022},
doi = {10.1109/ACCESS.2022.3228552},
url = {https://doi.org/10.1109/ACCESS.2022.3228552},
researchr = {https://researchr.org/publication/ParkKALLYSM22},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {10},
pages = {130001-130023},
}