Seung-ok Park, Hongsuk Kim, Jung Man Park, Jae Kwon Eem. Development of Spectral Sensitivity Measurement System of Image Sensor Devices. In 3rd Color and Imaging Conference, CIC 1995, Scottsdale, Arizona, USA, November 7-10, 1995. pages 115-118, IS&T - The Society for Imaging Science and Technology, 1995. [doi]
Abstract is missing.