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Jaewon Park, Jae-Hoon Lee, Sang-Kil Park, Ki Chul Chun, Kyomin Sohn, Sungho Kang. An In-DRAM BIST for 16 Gb DDR4 DRAM in the 2nd 10-nm-Class DRAM Process. IEEE Access, 9:33487-33497, 2021. [doi]
Abstract is missing.