A fully integrated Phase-locked loop with leakage current compensation in 65-nm CMOS technology

Se-Chun Park, Seung-Baek Park, Soo-Won Kim. A fully integrated Phase-locked loop with leakage current compensation in 65-nm CMOS technology. In IEEE International Conference on Consumer Electronics, ICCE 2015, Las Vegas, NV, USA, January 9-12, 2015. pages 587-588, IEEE, 2015. [doi]

Abstract

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