Laurence A. F. Park, Simeon Simoff. Using Entropy as a Measure of Acceptance for Multi-label Classification. In Élisa Fromont, Tijl De Bie, Matthijs van Leeuwen, editors, Advances in Intelligent Data Analysis XIV - 14th International Symposium, IDA 2015, Saint Etienne, France, October 22-24, 2015, Proceedings. Volume 9385 of Lecture Notes in Computer Science, pages 217-228, Springer, 2015. [doi]
Abstract is missing.