Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model

Joonsung Park, Hongjoong Shin, Jacob A. Abraham. Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model. J. Electronic Testing, 27(3):321-334, 2011. [doi]

Abstract

Abstract is missing.