Jounghun Park, Gilsang Yoon, Donghyun Go, Donghwi Kim, Ukju An, Jongwoo Kim, Jungsik Kim, Jeong-Soo Lee. Decomposition of Vertical and Lateral Charge Loss in Long-term Retention of 3-D NAND Flash Memory. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-4, IEEE, 2023. [doi]
Abstract is missing.