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Extraction of Nitride Trap Profile in 3-D NAND Flash Memory Using Intercell Program Pattern

Jounghun Park, Gilsang Yoon, Donghyun Go, Jungsik Kim, Jeong-Soo Lee. Extraction of Nitride Trap Profile in 3-D NAND Flash Memory Using Intercell Program Pattern. IEEE Access, 9:118794-118800, 2021. [doi]

Authors

Jounghun Park

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Gilsang Yoon

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Donghyun Go

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Jungsik Kim

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Jeong-Soo Lee

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