SENSE factors for reliable cortical thickness measurement

Hae-Jeong Park, Tak Youn, Seok-Oh Jeong, Maeng-Keun Oh, Sei-young Kim, Eung-Yeop Kim. SENSE factors for reliable cortical thickness measurement. NeuroImage, 40(1):187-196, 2008. [doi]

Authors

Hae-Jeong Park

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Tak Youn

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Seok-Oh Jeong

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Maeng-Keun Oh

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Sei-young Kim

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Eung-Yeop Kim

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