Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa. Design, Fabrications and Use of Mixed-Signal IC Testability Structures. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 489-498, IEEE Computer Society, 1997.
Abstract is missing.