Charna R. Parkey, Wasfy B. Mikhael, David B. Chester. Cumulant characterizations of ADC error sources with applications to Time Interleaved ADCs. In 55th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2012, Boise, ID, USA, August 5-8, 2012. pages 1152-1155, IEEE, 2012. [doi]
Abstract is missing.