A Hamming code based technique to resolve the bit flip impact on compressed VLSI test data in IP core based SoC

Harikrishna Parmar, Usha Mehta. A Hamming code based technique to resolve the bit flip impact on compressed VLSI test data in IP core based SoC. In 19th International Symposium on VLSI Design and Test, VDAT 2015, Ahmedabad, India, June 26-29, 2015. pages 1-6, IEEE, 2015. [doi]

Abstract

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