Owain Parry, Michael Hilton, Gregory M. Kapfhammer, Phil McMinn. What Do Developer-Repaired Flaky Tests Tell Us About the Effectiveness of Automated Flaky Test Detection?. In IEEE/ACM International Conference on Automation of Software Test, AST@ICSE 2022, Pittsburgh, PA, USA, May 21-22, 2022. pages 160-164, IEEE, 2022. [doi]
Abstract is missing.