Towards Simultaneous Delay-Fault Built-In Self-Test and Partial-Scan Insertion - researchr publication authors

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Ganapathy Parthasarathy, Michael L. Bushnell. Towards Simultaneous Delay-Fault Built-In Self-Test and Partial-Scan Insertion. In 16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA. pages 210-217, IEEE Computer Society, 1998. [doi]

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