BIST and production testing of ADCs using imprecise stimulus

Kumar L. Parthasarathy, Turker Kuyel, Dana Price, Le Jin, Degang Chen, Randall L. Geiger. BIST and production testing of ADCs using imprecise stimulus. ACM Trans. Design Autom. Electr. Syst., 8(4):522-545, 2003. [doi]

Abstract

Abstract is missing.