Bertrand Parvais, Piet Wambacq, Abdelkarim Mercha, Diederik Verkest, Aaron Thean, Ken Sawada, Kazuki Nomoto, Tetsuya Oishi, Hiroaki Ammo. A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS. In IEEE Asian Solid-State Circuits Conference, A-SSCC 2015, Xia'men, China, November 9-11, 2015. pages 1-4, IEEE, 2015. [doi]
Abstract is missing.