Alessio Di Pasquo, Enrico Monaco, Claudio Nani, Luca Fanucci. Delay-lines jitter modeling and efficiency analysis in FinFET technology. In 28th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2021, Dubai, United Arab Emirates, November 28 - Dec. 1, 2021. pages 1-5, IEEE, 2021. [doi]
Abstract is missing.