Best of both worlds: integration of split manufacturing and camouflaging into a security-driven CAD flow for 3D ICs

Satwik Patnaik, Mohammed Ashraf, Ozgur Sinanoglu, Johann Knechtel. Best of both worlds: integration of split manufacturing and camouflaging into a security-driven CAD flow for 3D ICs. In Iris Bahar, editor, Proceedings of the International Conference on Computer-Aided Design, ICCAD 2018, San Diego, CA, USA, November 05-08, 2018. pages 8, ACM, 2018. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.