Somnath Paul, Rajat Subhra Chakraborty, Swarup Bhunia. VIm-Scan: A Low Overhead Scan Design Approach for Protection of Secret Key in Scan-Based Secure Chips. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 455-460, IEEE Computer Society, 2007. [doi]
Abstract is missing.