Maria-Alexandra Paun. Hall mobility study of hall structures in two different CMOS technological processes. In Ljupco Karadzinov, Goga Cvetkovski, Pero Latkoski, editors, IEEE EUROCON 2017 -17th International Conference on Smart Technologies, Ohrid, Macedonia, July 6-8, 2017. pages 234-238, IEEE, 2017. [doi]
Abstract is missing.