A fusion prognostics-based qualification test methodology for microelectronic products

Michael Pecht, Tadahiro Shibutani, Myeongsu Kang, Melinda Hodkiewicz, Edward Cripps. A fusion prognostics-based qualification test methodology for microelectronic products. Microelectronics Reliability, 63:320-324, 2016. [doi]

Abstract

Abstract is missing.