Songwei Pei, Huawei Li, Xiaowei Li. Flip-Flop Selection for Transition Test Pattern Reduction Using Partial Enhanced Scan. In 2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2009, Shanghai, China, 16-18 November 2009. pages 75-80, IEEE Computer Society, 2009. [doi]
Abstract is missing.