Huan-Kai Peng, Charles H.-P. Wen, Jayanta Bhadra. On soft error rate analysis of scaled CMOS designs - A statistical perspective. In 2009 International Conference on Computer-Aided Design (ICCAD 09), November 2-5, 2009, San Jose, CA, USA. pages 157-163, IEEE, 2009. [doi]
Abstract is missing.