Fulin Peng, Handi Yu, Jun Tao 0001, Yangfeng Su, Dian Zhou, Xuan Zeng 0001, Xin Li 0001. Efficient Statistical Analysis for Correlated Rare Failure Events via Asymptotic Probability Approximation. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(12):4971-4984, 2020. [doi]
Abstract is missing.