Alexandre Perez, Rui Abreu, Arie van Deursen. A test-suite diagnosability metric for spectrum-based fault localization approaches. In Sebastián Uchitel, Alessandro Orso, Martin P. Robillard, editors, Proceedings of the 39th International Conference on Software Engineering, ICSE 2017, Buenos Aires, Argentina, May 20-28, 2017. pages 654-664, IEEE / ACM, 2017. [doi]
Abstract is missing.