Test Generation and Fault Localization for Quantum Circuits

Marek A. Perkowski, Jacob Biamonte, Martin Lukac. Test Generation and Fault Localization for Quantum Circuits. In 35th IEEE International Symposium on Multiple-Valued Logic (ISMVL 2005), 18-21 May 2005, Calgary, Canada. pages 62-68, IEEE Computer Society, 2005. [doi]

Abstract

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