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Blockchain applications for legal metrology

Daniel Peters, Jan Wetzlich, Florian Thiel, Jean-Pierre Seifert. Blockchain applications for legal metrology. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018, Houston, TX, USA, May 14-17, 2018. pages 1-6, IEEE, 2018. [doi]

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Daniel Peters

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Jan Wetzlich

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Florian Thiel

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Jean-Pierre Seifert

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