Blockchain applications for legal metrology

Daniel Peters, Jan Wetzlich, Florian Thiel, Jean-Pierre Seifert. Blockchain applications for legal metrology. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018, Houston, TX, USA, May 14-17, 2018. pages 1-6, IEEE, 2018. [doi]

@inproceedings{PetersWTS18,
  title = {Blockchain applications for legal metrology},
  author = {Daniel Peters and Jan Wetzlich and Florian Thiel and Jean-Pierre Seifert},
  year = {2018},
  doi = {10.1109/I2MTC.2018.8409668},
  url = {https://doi.org/10.1109/I2MTC.2018.8409668},
  researchr = {https://researchr.org/publication/PetersWTS18},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018, Houston, TX, USA, May 14-17, 2018},
  publisher = {IEEE},
  isbn = {978-1-5386-2222-3},
}