Brett Peterson, Kartikeya Mayaram, Terri S. Fiez. Automated Extraction of Model Parameters for Noise Coupling Analysis in Silicon Substrates. In Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007, DoubleTree Hotel, San Jose, California, USA, September 16-19, 2007. pages 853-856, IEEE, 2007. [doi]
Abstract is missing.