V. Petrescu, M. Pelgrom, H. Veendrick, P. Pavithran, J. Wieling. A Signal-Integrity Self-Test Concept for Debugging Nanometer CMOS ICs. In 2006 IEEE International Solid State Circuits Conference, ISSCC 2006, Digest of Technical Papers, an Francisco, CA, USA, February 6-9, 2006. pages 2220-2229, IEEE, 2006. [doi]
Abstract is missing.