L. Pfeifer, M. Gross, Felix Staudigl, Rainer Leupers, Jan Moritz Joseph. Analysis of Thermal Side-Channel Attacks on Analog/Digital Computing-in-Memory Accelerators. In 25th IEEE Latin American Test Symposium, LATS 2024, Maceio, Brazil, April 9-12, 2024. pages 1-4, IEEE, 2024. [doi]
Abstract is missing.